Re: OT (Complexity makes for a) Desperate situation

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Joel Rees wrote:
[...]
In fairness, computers are now so complex that it is almost inevitable that some unforeseen circumstances will arise. Not that this has any relevance to the problem I've just had, but I don't feel that it is possible, today, for any systems designers to be absolutely sure that nothing odd could happen.

Umm, not so. I recall my "software engineers" complaining that
their software/firmware could not anticipate every possible
circumstance. I would point out to them that "Your code is going to
do *something* in every circumstance. What it does can either
be something you *chose* for it to do, a *considered* decision,
or it can be something you simply *let* it do, *without*
any consideration. Which do you prefer to have to support?"

These days, all the "complex interactions" are pretty much due
to intelligent devices with uCs running firmware. If it does
something weird, then that's just some firmware writer being
in a certain sense "lazy".


I would say that depends on the definition of lazy. It's kind of like

I put it in quotes. A *really* lazy programmer (like me) tries to make
his code as absolutely bullet proof as possible before going to test.
The more time spent in getting good requirements, the better. IIRC, the
costs for recovery go up about 3x going from requirements to design to
code at each step, and then about 9x to rlease.

professors who stand up in the intro to compilers class and say, "A good
compiler could completely do away with the need for a program stack." In
the ideal, yes, but ideal processors have infinite memory and run at
infinite speed.

Sure, there are plenty of lazy engineers, programmers, and techs, and
plenty of impatient project managers, and plenty of sales personnel only
too happy to promise impossible delivery dates, etc., but there are also
problems that are difficult to solve, and testing can definitely be part
of that class of problems, particularly when the machine being built has
to deal with humans fumbling around.

It is impossible to "test in" quality. It begins with requirements.
The purpose of test should be to verify proper operation, not to
find defects. It is much more efficient to find defects by means
of inspection/review. And that starts, as I said, with requirements.

I don't think anyone has yet found a solution to the general class of
NP-complete problems.

Please give an example of an NP-complete problem which must be
solved by firmware in the electronics of an ATA disc drive.
Not many traveling salesmen in my discs...

Mike
--
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I can explain it for you, but I can't understand it for you.
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