[2.6.15] PDC202XX error: "no DRQ after issuing MULTWRITE_EXT"

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I upgraded my kernel from a Debian linux-image-2.6.12-1-powerpc kernel (with a patch to the powermac IDE driver to prevent deactivating empty interfaces) to a Debian linux-image-2.6.15-powerpc kernel and started getting the following message in the logs. It refers to a Samsung PATA drive attached to the secondary channel on a Sonnet Tempo ATA/100. The card is a rebranded FirmTek UltraTek/100 which is actually a PDC20268 with a Mac-bootable firmware ROM. 

hda: status timeout: status=0xd0 { Busy }
PDC202XX: Secondary channel reset.
hdi: no DRQ after issuing MULTWRITE_EXT
ide4: reset: success
The message seems to occur randomly, and does not coincide with the routine SMART testing of the drive (triggered by smartd) or the routing SMART status monitoring run from a custom Perl curses application. The output of "smartctl -a /dev/hdi" is attached. You will notice that all diagnostics appear to be perfectly OK, and repeated checks of the RAID for internal consistency all indicate correctness, so it's not an urgent data-corruption issue, but I believe it merits further investigation. 

Thanks for your time!

Cheers,
Kyle Moffett
smartctl version 5.34 [powerpc-unknown-linux-gnu] Copyright (C) 2002-5 Bruce Allen 
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model:     SAMSUNG SP0822N
Serial Number:    S06QJ10Y946116
Firmware Version: WA100-32
User Capacity:    80,060,424,192 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   6
ATA Standard is:  ATA/ATAPI-6 T13 1410D revision 1
Local Time is:    Sun Mar 12 00:56:28 2006 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== STARRT OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82) Offline data collection activity
                                        was completed without error.
Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self- test has ever 
                                        been run.
Total time to complete Offline
data collection:                 (1980) seconds
Offline data collection
capabilities:                    (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off suppport. Suspend Offline collection upon new 
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
No Conveyance Self-test supported. 
                                        Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
No General Purpose Logging support. 
Short self-test routine
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        (  33) minutes.

SMART Attributes Data Structure revision number: 17
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 099 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 252 252 011 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 252 252 000 Old_age Always - 0 5 Reallocated_Sector_Ct 0x0033 252 252 011 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 252 252 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 092 092 015 Pre-fail Offline - 3730 9 Power_On_Half_Minutes 0x0032 099 099 000 Old_age Always - 29h+25m 10 Spin_Retry_Count 0x0033 252 252 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0012 252 252 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 252 252 000 Old_age Always - 0 190 Unknown_Attribute 0x0022 142 133 000 Old_age Always - 37 194 Temperature_Celsius 0x0022 145 133 000 Old_age Always - 36 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 0 196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0 197 Current_Pending_Sector 0x0012 252 252 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 199 199 000 Old_age Always - 173 200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0 201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0 

Warning! SMART ATA Error Log Structure error: invalid SMART checksum.
SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 0
Warning: ATA Specification requires self-test log structure revision number = 1 Num Test_Description Status Remaining LifeTime (hours) LBA_of_first_error # 1 Short offline Completed without error 00% 3511 - # 2 Short offline Completed without error 00% 3487 - # 3 Short offline Completed without error 00% 3463 - # 4 Short offline Completed without error 00% 3439 - # 5 Short offline Completed without error 00% 3415 - # 6 Short offline Completed without error 00% 3391 - # 7 Extended offline Completed without error 00% 3367 - # 8 Short offline Completed without error 00% 3343 - # 9 Short offline Completed without error 00% 3319 - #10 Short offline Completed without error 00% 3295 - #11 Short offline Completed without error 00% 3271 - #12 Short offline Completed without error 00% 3247 - #13 Short offline Completed without error 00% 3223 - #14 Extended offline Completed without error 00% 3200 - #15 Short offline Completed without error 00% 3175 - #16 Short offline Completed without error 00% 3151 - #17 Short offline Completed without error 00% 3127 - #18 Short offline Completed without error 00% 3103 - #19 Short offline Completed without error 00% 3080 - #20 Short offline Completed without error 00% 3056 - #21 Extended offline Completed without error 00% 3032 -
SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data structure revision number = 1 
 SPAN         MIN_LBA          MAX_LBA  CURRENT_TESET_STATUS
    1               0                0  Not_testing
    2               0                0  Not_testing
    3 281479271677952                0  Not_testing
    4               0  281479271767952  Not_testing
    5          604800                4  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay. 

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