SMART over USB - problem

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SMART over USB - problem

usb--------------------------------------------------------
# smartctl -a -T verypermissive /dev/sde
smartctl version 5.33 Copyright (C) 2002-4 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

Device: WDC WD25 00JB-00GVA0      Version: 08.0
scsiModePageOffset: response length too short, resp_len=4 offset=4 bd_len=0
>> Terminate command early due to bad response to IEC mode page

Error Counter logging not supported

Error Events logging not supported
scsiModePageOffset: response length too short, resp_len=4 offset=4 bd_len=0
Device does not support Self Test logging

# smartctl -a -T verypermissive /dev/sdd
smartctl version 5.33 Copyright (C) 2002-4 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

Device: WDC WD30 00JB-00KFA0      Version: 08.0
scsiModePageOffset: response length too short, resp_len=4 offset=4 bd_len=0
>> Terminate command early due to bad response to IEC mode page

Error Counter logging not supported

Error Events logging not supported
scsiModePageOffset: response length too short, resp_len=4 offset=4 bd_len=0
Device does not support Self Test logging

ide----------------------------------------------------------
# smartctl -a -T verypermissive /dev/hda
smartctl version 5.33 Copyright (C) 2002-4 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model:     WDC WD1200BB-22CAA0
Serial Number:    WD-WMA8Cxxxxxxx
Firmware Version: 16.06V16
User Capacity:    120,034,123,776 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   5
ATA Standard is:  Exact ATA specification draft version not indicated
Local Time is:    Thu Dec  1 14:17:57 2005 CST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82) Offline data collection activity
                                        was completed without error.
                                        Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0) The previous self-test routine completed
                                        without error or no self-test has ever
                                        been run.
Total time to complete Offline
data collection:                 (4680) seconds.
Offline data collection
capabilities:                    (0x3b) SMART execute Offline immediate.
                                        Auto Offline data collection on/off supp ort.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        Conveyance Self-test supported.
                                        No Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        No General Purpose Logging support.
Short self-test routine
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        (  87) minutes.
Conveyance self-test routine
recommended polling time:        (   5) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_ FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   200   200   051    Pre-fail  Always       -        0
  3 Spin_Up_Time            0x0007   099   091   021    Pre-fail  Always       -        5841
  4 Start_Stop_Count        0x0032   100   100   040    Old_age   Always       -        708
  5 Reallocated_Sector_Ct   0x0033   200   200   140    Pre-fail  Always       -        0
  7 Seek_Error_Rate         0x000b   200   200   051    Pre-fail  Always       -        0
  9 Power_On_Hours          0x0032   086   086   000    Old_age   Always       -        10517
10 Spin_Retry_Count        0x0013   100   100   051    Pre-fail  Always       -        0
11 Calibration_Retry_Count 0x0013   100   100   051    Pre-fail  Always       -        0
12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -        686
196 Reallocated_Event_Count 0x0032   200   200   000    Old_age   Always       -        0
197 Current_Pending_Sector  0x0012   200   200   000    Old_age   Always       -        0
198 Offline_Uncorrectable   0x0012   200   200   000    Old_age   Always       -        0
199 UDMA_CRC_Error_Count    0x000a   200   253   000    Old_age   Always       -        0
200 Multi_Zone_Error_Rate   0x0009   200   200   051    Pre-fail  Offline      -        0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


Device does not support Selective Self Tests/Logging
#
-----------------------------------------------------------------------

ide---works
usb---not

(USB-external-case) or (eide-usb-scsi conversion) ???

xboom 
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